Authors:
Junyeon JEON, Bratati Das
MIT Supply Chain Management Program (SCM)
Summary:
This project focuses on improving inventory management for front‑end fab spare parts at Analog Devices. We cluster spare parts based on lead time, demand patterns, price, and criticality, and then apply a data envelopment analysis (DEA) model to assign an inventory score to each cluster and link those scores to stocking policies.
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