Catch ‘Em(ission) if You Can! Emission Hotspot and Outliers Identification for Dell

Authors:
Dhorn Kosolpatanadurong, Hansika Gupta
MIT Supply Chain Management Program

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Summary:
With countless sustainability initiatives globally, companies and experts are faced with not only the challenges of assessing and allocating the emission data accurately but also the validity of the data reported themselves. Our team proposes outlier identification approaches using statistical and analytical methods on the data reported from suppliers of complex commodities to Dell Technologies.


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